Nano-Observer II
Advanced, Versatile Atomic Force Microscope
The Nano-Observer II is a cutting-edge Atomic Force Microscope (AFM) that combines flexibility, exceptional performance, and user-friendly operation. Designed for both advanced users and beginners, it offers a wide range of capabilities for nanoscale imaging and characterization.
Application fields
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Materials Science
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Semiconductor Research
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Polymer Studies
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Biological Samples
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2D Materials Characterization
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Photovoltaics
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Electrochemistry
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Corrosion Studies
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Nanomechanical Analysis
Key Features
AutoScan Software: Easier & Faster Automated Scan
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Auto approach (automated fast and gentle final approach)
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Autogain: realtime active AFM feedback gains
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Setpoint conditions: preset Setpoints
(For Soft, Medium or Hard interaction)
User-Friendly Design
- Compact AFM head with pre-positioned tip system
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Eliminate manual laser alignment
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Top and side views of the tip/sample area for efficient pre-approach process
Hydroxyphthioceranic acid (C36)
Scan size 500x500 nm
Real-time video on our YouTube video: Click Here
Advanced Technology Integration
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USB 24-bit controller with built-in lock-in capabilities
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Enhanced measurement precision for phase detection and Piezo-Response Mode
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HD-KFM, ResiScope, and Soft Intermittent Contact Mode for high-resolution imaging
High-Performance Scanning
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Low-noise, high-resolution scanning capabilities
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Large-small area scans without changing scan head
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Consistent resolution across all scan sizes
Oxide film grown on stainless steel Scan Size:1x1 micron
Doping test sample used by semiconductor industry to improve doping concentration process.
Sample: Polymer Battery Scan size: 80 microns
Semiconductors/microelectronics Scan size: 50x50 microns
Perovskite Solar cell (2µm scan)