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Nano-Observer II Advanced AFM

Nano-Observer II
Advanced, Versatile Atomic Force Microscope

The Nano-Observer II is a cutting-edge Atomic Force Microscope (AFM) that combines flexibility, exceptional performance, and user-friendly operation. Designed for both advanced users and beginners, it offers a wide range of capabilities for nanoscale imaging and characterization.

Application fields

  • Materials Science

  • Semiconductor Research

  • Polymer Studies

  • Biological Samples

  • 2D Materials Characterization

  • Photovoltaics

  • Electrochemistry

  • Corrosion Studies

  • Nanomechanical Analysis

Key Features

AutoScan Software: Easier & Faster Automated Scan

  • Auto approach (automated fast and gentle final approach)

  • Autogain: realtime active AFM feedback gains

  • Setpoint conditions: preset Setpoints
    (For Soft, Medium or Hard interaction)

Nano-Observer User Interface AutoScan
Nano-Observer User Interface AutoScan
Nano-Observer User Interface AutoScan

User-Friendly Design

  • Compact AFM head with pre-positioned tip system
  • Eliminate manual laser alignment

  • Top and side views of the tip/sample area for efficient pre-approach process

Hydroxyphthioceranic acid (C36) molecule imaging with atomic force microsocpy

Hydroxyphthioceranic acid (C36)

Scan size 500x500 nm 

Real-time video on our YouTube video: Click Here

Advanced Technology Integration

  • USB 24-bit controller with built-in lock-in capabilities

  • Enhanced measurement precision for phase detection and Piezo-Response Mode

  • HD-KFM, ResiScope, and Soft Intermittent Contact Mode for high-resolution imaging

ResiScope Logo
HD-KFM Logo
Soft IC Mode

High-Performance Scanning

  • Low-noise, high-resolution scanning capabilities

  • Large-small area scans without changing scan head

  • Consistent resolution across all scan sizes