<?xml version="1.0" encoding="UTF-8"?><rss xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:content="http://purl.org/rss/1.0/modules/content/" xmlns:atom="http://www.w3.org/2005/Atom" version="2.0"><channel><title><![CDATA[CSInstruments]]></title><description><![CDATA[CSInstruments: Leading provider of advanced AFM solutions. Cutting-edge Nano-Observer II and modules for precise nanoscale research across industries.]]></description><link>https://www.csi-afm.com/afm-applications-news</link><generator>RSS for Node</generator><lastBuildDate>Thu, 01 Oct 2026 22:14:15 GMT</lastBuildDate><atom:link href="https://www.csiafm.com/blog-feed.xml" rel="self" type="application/rss+xml"/><item><title><![CDATA[HD-KFM &#38; AFM Characterization of 2D Materials]]></title><description><![CDATA[Mapping surface potential, work function, and conductivity in graphene, hBN, and MoS₂ at the nanoscale — from moiré superlattices to layer-by-layer electronic structure. Graphene Layer Identification - hBN Moiré Pattern Imaging - MoS₂ Layer-Dependent Conductivity - Single-Pass KPFM - ResiScope™ - Resistance Mapping Why 2D Materials Demand Nanoscale Electrical Characterization The electronic properties of 2D materials — graphene, hexagonal boron nitride (hBN), transition metal dichalcogenides...]]></description><link>https://www.csi-afm.com/post/hd-kfm-afm-characterization-of-2d-materials</link><guid isPermaLink="false">69c2a1e769ed8cb882add037</guid><pubDate>Tue, 24 Mar 2026 14:45:31 GMT</pubDate><enclosure url="https://static.wixstatic.com/media/58ed36_cf1fad27d5f849fc85800c242b6498e4~mv2.png/v1/fit/w_1000,h_1000,al_c,q_80/file.png" length="0" type="image/png"/><dc:creator>marketing78010</dc:creator></item><item><title><![CDATA[AFM Characterization of Battery Electrode Materials]]></title><description><![CDATA[Why standard conductive AFM fails on battery electrodes — and how ResiScope™'s 10-decade dynamic range resolves conductivity heterogeneity that C-AFM cannot measure. ResiScope™ · Resistance Mapping · Soft ResiScope™ · HD-KFM III · Surface Potentia · lC-AFM Comparison ·  Polymer Battery · Li-ion Electrode The Challenge Battery Electrodes Span 10 Orders of Magnitude in Conductivity A single 60–80 µm scan of a polymer battery electrode contains domains ranging from picoampere-level insulating...]]></description><link>https://www.csi-afm.com/post/afm-characterization-ofbattery-electrode-materials</link><guid isPermaLink="false">69c2a0a3e959cef02a7d1eef</guid><pubDate>Tue, 24 Mar 2026 14:35:44 GMT</pubDate><dc:creator>marketing78010</dc:creator></item><item><title><![CDATA[AFM Characterization of Perovskite Solar Cells]]></title><description><![CDATA[How KPFM and ResiScope™ reveal grain boundary potentials, nanoscale charge transport, and defect distribution in perovskite and organic photovoltaic films — from lab-scale optimization to degradation analysis. KPFM · Surface PotentialResiScope™ · Resistance MappingGrain Boundary AnalysisHD-KFM IIIOrganic PVSilicon Solar Cells The Challenge Why Macroscopic Measurements Are Not Enough Perovskite solar cell efficiency is governed by nanoscale phenomena that bulk measurements cannot resolve:...]]></description><link>https://www.csi-afm.com/post/afm-characterization-of-perovskite-solar-cells</link><guid isPermaLink="false">69c29f46f5fd8925861b6882</guid><pubDate>Tue, 24 Mar 2026 14:32:10 GMT</pubDate><dc:creator>marketing78010</dc:creator></item><item><title><![CDATA[Engineering Selective Terahertz Photodetection]]></title><description><![CDATA[Validating Nanoscale Conductivity in HA-MWCNT Rectennas Terahertz (THz) technology is a frontier for non-destructive imaging, high-speed communication, and advanced surveillance. However, the practical application of THz sensors often requires wavelength selectivity —the ability to isolate specific frequencies within the electromagnetic spectrum. A groundbreaking study recently published in Materials Today Nano  addresses this by utilizing horizontally aligned multi-walled carbon nanotubes...]]></description><link>https://www.csi-afm.com/post/terahertz-photodetection-afm</link><guid isPermaLink="false">6980c6ba889819a51f049e3f</guid><pubDate>Mon, 02 Feb 2026 15:47:51 GMT</pubDate><enclosure url="https://static.wixstatic.com/media/5efe5c_174e91586427460f9b81b5b19f4f84fd~mv2.png/v1/fit/w_691,h_366,al_c,q_80/file.png" length="0" type="image/png"/><dc:creator>marketing78010</dc:creator></item><item><title><![CDATA[Scalable 2D Semiconductor Nanocircuits]]></title><description><![CDATA[Non-Invasive Additive Nanofabrication &#38; Multi-Modal Electrical Nanoscopy The Challenge of 2D Semiconductor Nanofabrication Two-dimensional transition metal dichalcogenides (TMDs) like MoS₂ hold enormous promise for next-generation nanoelectronics and photonics. However, integrating these atomically thin materials into functional nanocircuits requires: Large-scale uniform growth (cm² substrates) Nanoscale patterning without contamination or damage Preservation of semiconducting properties...]]></description><link>https://www.csi-afm.com/post/2d-semiconductor-nanocircuits</link><guid isPermaLink="false">6980c5521dce0ff3f1065db6</guid><pubDate>Mon, 02 Feb 2026 15:44:19 GMT</pubDate><enclosure url="https://static.wixstatic.com/media/5efe5c_2c67fdf41aab4d6db114f12106d5f7ae~mv2.png/v1/fit/w_1000,h_734,al_c,q_80/file.png" length="0" type="image/png"/><dc:creator>marketing78010</dc:creator></item><item><title><![CDATA[ResiScope™ III: Revolutionary Nanoscale Electrical Characterization for Advanced Materials Research]]></title><description><![CDATA[The ResiScope™ III represents a groundbreaking advancement in nanoscale electrical characterization for Atomic Force Microscopy (AFM). This state-of-the-art module delivers unprecedented measurement precision across an extensive resistance and current range, powered by intelligent, real-time adaptive electronics. Designed for researchers in renewable energy, semiconductors, advanced materials, and emerging nanomaterials, the ResiScope™ III overcomes the limitations of traditional conductive...]]></description><link>https://www.csi-afm.com/post/advanced-conductive-afm</link><guid isPermaLink="false">697f83dfafd4a3da35121bd1</guid><pubDate>Sun, 01 Feb 2026 17:09:12 GMT</pubDate><enclosure url="https://static.wixstatic.com/media/5efe5c_35a0af02fa7b4d72bb34351a8d4a8104~mv2.png/v1/fit/w_842,h_468,al_c,q_80/file.png" length="0" type="image/png"/><dc:creator>marketing78010</dc:creator></item><item><title><![CDATA[Nanoscale AFM Breakthrough: Advanced Characterization Techniques for Next-Generation Solar Cells]]></title><description><![CDATA[The race toward more efficient, stable, and affordable photovoltaic technology has led researchers to an exciting new frontier: the nanoscale. Today, it's widely recognized that a solar cell's macro-level performance stems from complex interactions at the nanometer scale—from the morphology of active layers to the electronic structure of interfaces and charge transport pathways. This is especially critical for next-generation photovoltaic technologies. In organic solar cells (OSCs), charge...]]></description><link>https://www.csi-afm.com/post/perovskite-solar-cell-afm</link><guid isPermaLink="false">697f24e5afd4a3da35114d2b</guid><pubDate>Sun, 01 Feb 2026 10:15:06 GMT</pubDate><enclosure url="https://static.wixstatic.com/media/5efe5c_5876ee3ac2b7414aa2551ef6149802e8~mv2.png/v1/fit/w_702,h_362,al_c,q_80/file.png" length="0" type="image/png"/><dc:creator>marketing78010</dc:creator></item><item><title><![CDATA[Unlocking the Nanoscale: How HD-KFM Technology is Revolutionizing 2D Materials Characterization]]></title><description><![CDATA[Since the groundbreaking discovery of graphene in 2004, two-dimensional (2D) materials have captured the imagination of materials scientists worldwide. These atomically thin materials—including graphene, hexagonal boron nitride (hBN), and molybdenum disulfide (MoS₂)—exhibit extraordinary electrical, mechanical, and optical properties that promise to revolutionize everything from flexible electronics to quantum computing. However, there's a critical challenge: how do you accurately...]]></description><link>https://www.csi-afm.com/post/kpfm-on-2d-materials</link><guid isPermaLink="false">697f1cef639cc26dde31de22</guid><pubDate>Sun, 01 Feb 2026 09:42:10 GMT</pubDate><enclosure url="https://static.wixstatic.com/media/5efe5c_5fd8c5c607c84e6e9b2ac9e400a5b8e2~mv2.png/v1/fit/w_550,h_550,al_c,q_80/file.png" length="0" type="image/png"/><dc:creator>marketing78010</dc:creator></item><item><title><![CDATA[AFM Upgrades and Nanotechnology Breakthroughs in Research and Academia]]></title><description><![CDATA[We are delighted to share recent achievements and milestones from our global collaborations, showcasing the power of cutting-edge Atomic...]]></description><link>https://www.csi-afm.com/post/afm-upgrades-and-nanotechnology-breakthroughs-in-research-and-academia</link><guid isPermaLink="false">67c968b0704201787dbf10ff</guid><pubDate>Sun, 01 Feb 2026 09:24:48 GMT</pubDate><enclosure url="https://static.wixstatic.com/media/58ed36_1998ea9e60cc4a11b1069a072d4f5d1a~mv2.png/v1/fit/w_1000,h_844,al_c,q_80/file.png" length="0" type="image/png"/><dc:creator>marketing78010</dc:creator></item><item><title><![CDATA[HD-KFM III: Pushing the Boundaries of Nanoscale Electrical Characterization]]></title><description><![CDATA[In the world of nanotechnology, seeing is believing. But what if you could not only see but also measure electrical properties at the...]]></description><link>https://www.csi-afm.com/post/kfm-pushing-the-boundaries-of-nanoscale-electrical-characterization</link><guid isPermaLink="false">66fa7645db76332839cf8c40</guid><pubDate>Mon, 30 Sep 2024 10:10:07 GMT</pubDate><enclosure url="https://static.wixstatic.com/media/58ed36_cf1fad27d5f849fc85800c242b6498e4~mv2.png/v1/fit/w_1000,h_1000,al_c,q_80/file.png" length="0" type="image/png"/><dc:creator>marketing78010</dc:creator></item><item><title><![CDATA[Kyoto University Advances Nanoscale Research with Galaxy Dual Controller Upgrade for an Old AFM]]></title><description><![CDATA[Revitalizing Legacy AFM Systems for Cutting-Edge Science Kyoto University, renowned for its pioneering research in materials science and...]]></description><link>https://www.csi-afm.com/post/kyoto-university-advances-nanoscale-research-with-galaxy-dual-controller-upgrade</link><guid isPermaLink="false">66e8cb3591ee0884d3313125</guid><pubDate>Tue, 17 Sep 2024 00:34:43 GMT</pubDate><enclosure url="https://static.wixstatic.com/media/58ed36_7b7bb9bb239248e49e8e03cfd4462c28~mv2.jpg/v1/fit/w_1000,h_1000,al_c,q_80/file.png" length="0" type="image/png"/><dc:creator>marketing78010</dc:creator></item><item><title><![CDATA[Advancing Battery Technology with Atomic Force Microscopy: Insights at the Nanoscale]]></title><description><![CDATA[In the race to develop more efficient, durable, and powerful batteries, researchers are turning to advanced characterization techniques...]]></description><link>https://www.csi-afm.com/post/advancing-battery-technology-with-atomic-force-microscopy-insights-at-the-nanoscale</link><guid isPermaLink="false">66e8c68592b557eb6febda9d</guid><pubDate>Tue, 17 Sep 2024 00:15:42 GMT</pubDate><enclosure url="https://static.wixstatic.com/media/58ed36_ffe1f027891a4820930b452b850e0f3c~mv2.png/v1/fit/w_1000,h_1000,al_c,q_80/file.png" length="0" type="image/png"/><dc:creator>marketing78010</dc:creator></item></channel></rss>